This prevents premature sample destruction and allows for maximum workflow efficiency while combining full sample context with key sample information.Īdditionally, the ability to perform interior tomography, or to clearly see inside your sample in 3D, further reduces the risk of losing sight of your ROI. Rapidly scout at low resolution with a large field of view, and then zoom to the ROI at higher resolution, whether using the range of Versa objectives (up to 40X), nanoscale Xradia Ultra XRM, or ZEISS light, electron, or FIB-SEM microscopes. Using the Scout-and-Zoom capability of Versa, you are able to clearly define your region of interest (ROI) before sacrificing your sample to premature cutting or other sample prep. When your needs require pushing the resolution limits of your in situ experiments, convert your ZEISS Xradia microCT or XRM to an Xradia 620 Versa X-ray microscope and leverage RaaD technology for the maximum performance tomographic imaging of samples within in situ chambers or rigs.īecause of the non-destructive nature of X-rays and the versatile array of sample types and sizes they are able to image, correlative microscopy often begins with, or is enabled by, ZEISS Xradia Versa XRM.
#MICRO MACHINES WORLD SERIES DESCARGAR SOFTWARE#
You can add the optional in situ Interface Kit to your ZEISS Xradia XRM, which includes a mechanical integration kit, a robust cabling guide, and other facilities (feed-throughs) along with recipe-based software that simplifies your control from within the Versa Scout-and-Scan user interface. ZEISS Xradia XRM platforms can accommodate a variety of in situ rigs, from high-pressure flow cells to tension, compression, and thermal stages, to user-customized designs. ZEISS XRM are uniquely equipped with dual-stage magnification architecture with RaaD technology that enable the highest resolution for in situ imaging.
On traditional microCT systems, this significantly limits the resolution achievable for your samples. These studies require samples to be further away from the X-ray source to accommodate various types of in situ rigs. Moving beyond the three dimensions of space, leverage the non-destructive nature of X-ray investigation to extend your studies into the dimension of time with 4D experiments. ZEISS Xradia X-ray systems provide the industry's premier 3D imaging solution for the widest variety of in situ rigs, from high-pressure flow cells to tension, compression, and thermal stages. ✔ Characterize the microstructure of materials in their native-like environments in situ and study the evolution of properties over time (4D) ✔ Experience versatility for wide range of materials, including soft and low Z, with unique contrast solutions that overcome the limitations of traditional computed tomography ✔ Reduce dependence on geometric magnification and maintain submicron resolution even at large working distances An added benefit: ZEISS Xradia 510 Versa is easy to use by everyone in your busy lab. Multilength-scale capabilities enable you to image the same sample across a wide range of magnifications. ZEISS Xradia Versa XRM feature a unique two-stage process based on synchrotron caliber optics. Traditional computed tomography relies on a single stage of geometric magnification and maintaining high resolution for larger samples is impossible due to the longer working distances required. ZEISS Nanoscale and Correlative AnalysisĮxtend scientific research beyond the limits of projection-based microCT systems at submicron resolution with ZEISS Xradia 510 Versa XRM.
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